The Millennium Café runs 10-11am in the 3rd floor Café Commons of the MSC Bldg. Join researchers from across campus for a stellar cup of coffee and two <10 min interdisciplinary talks. All Millennium Café events are free and open to the Penn State community, include coffee and breakfast pastries, and are held in the third floor Café Commons of the Millennium Science Complex at University Park.
Diverse Applications of 3D X-ray Computed Tomography (CT) Imaging
Michelle Quigley | Center for Quantitative Imaging
This talk highlights some diverse applications of CT imaging relevant to multiple disciplines. These applications highlight the varied questions that can be addressed via CT and provide an overview of the services available at the Center for Quantitative Imaging, an IEE Shared Core Facility MicroCT imaging center at Penn State.
Combining Efforts in the Face of Climate Change
Erica Smithwick | Director, Earth and Environmental Systems Institute
How can Penn State leverage its resources and expand its partnerships to address the climate challenges faced in Pennsylvania and across this world? In Fall 2023, the Climate Consortium was established to address this question. In this talk, I will provide an overview of the Climate Consortium's mission and goals, review its themes and current activities, and I will invite dialogue on how best we can do that work together.
***After Café: Strategies for better Cross-Sectional Imaging - Immediately following the Cafe on Tuesday will be next After Café. Cross-sectional SEM imaging is commonly used in nanofabrication for coating thickness measurement, process verification, and failure analysis. Cleaving is frequently the method of choice for generating a cross-sectional sample for analysis. However, this approach may inadvertently damage the sample which then poses challenges for accurate imaging. By using a focused ion beam (FIB) instrument it is possible to create highly site specific cross sections with minimal artifacts for almost any structure/device/material. This talk will highlight several applications for the efficient use of FIB ross-sectional imaging to accurately characterize a range of devices and layered material systems.