Abstract: This presentation will focus on practical guidelines for the most efficient ways to apply x-ray diffraction (XRD) and reflectivity (XRR) for the characterization of various material systems. We will provide a brief review of basic concepts of x-ray analysis methods with focus on appropriate measurement strategies. Potential artifacts and errors when carrying out typical data collection and/or data processing will be discussed. We will cover a variety of representative case studies will be presented ranging from the analysis of powder materials, textured structures, complex heterostructures and multilayers requiring high-resolution configurations, and soft materials.
Host: Mauro Sardela (email@example.com), Director, Central Research Facilities, Materials Research Laboratory, University of Illinois at Urbana-Champaign
“Making the Best of a Bad Situation: A Characterization Seminar Series”
The analytical facilities at Penn State, the University of Illinois, the University of Wisconsin, and the University of Minnesota are collaborating on a free seminar series on characterization. One hour Zoom lectures will be held 3 times per week starting March 30. The initial lectures will provide broad overviews of various analytical techniques. Future lectures will address more specific measurements, applications and materials.
Upcoming Webinars in the Series
- April 6 - Introduction to Confocal Raman Microscopy
- April 8 - Rutherford Backscattering
- April 10 - Nanoindentation and Mechanical Properties with AFM