Abstract: XPS is the most widely utilized surface chemical analytical tools. It can provide a wealth of information from the outer several nanometers on any vacuum compatible material. This lecture will discuss the advantages and disadvantages of XPS and present a series of examples of problem solving using XPS.
Host: Jeff Shallenberger (firstname.lastname@example.org), Associate Director of MCL
“Making the Best of a Bad Situation: A Characterization Seminar Series”
The analytical facilities at Penn State, the University of Illinois, the University of Wisconsin, and the University of Minnesota are collaborating on a free seminar series on characterization. One hour Zoom lectures will be held 3 times per week starting March 30. The initial lectures will provide broad overviews of various analytical techniques. Future lectures will address more specific measurements, applications and materials.
Upcoming Webinars in the Series
- April 1 - Fundamentals of Secondary Ion Mass Spectrometry
- April 3 - Practical aspects in XRD/XRR analysis of materials
- April 6 - Introduction to Confocal Raman Microscopy
- April 8 - Rutherford Backscattering
- April 10 - Nanoindentation and Mechanical Properties with AFM