Abstract: Secondary Ion Mass Spectrometry offers analysis of inorganic and organic materials with ppm to ppb detection limits. Owing to its low detection limits and ability to obtain in-depth information dynamic-SIMS has been used extensively by the semiconductor community for depth profiling of dopants in a variety of electronic materials. More recently static-SIMS has been applied to organic and biological material analysis. This presentation will introduce users to both the dynamic SIMS and static SIMS techniques, including how the techniques work, quantification, instrumentation, strengths and limitations of the technique, and applications.
Host: Jerry Hunter (email@example.com), Director of the Wisconsin Centers for Nanoscale Technology, University of Wisconsin-Madison
“Making the Best of a Bad Situation: A Characterization Seminar Series”
The analytical facilities at Penn State, the University of Illinois, the University of Wisconsin, and the University of Minnesota are collaborating on a free seminar series on characterization. One hour Zoom lectures will be held 3 times per week starting March 30. The initial lectures will provide broad overviews of various analytical techniques. Future lectures will address more specific measurements, applications and materials.
Upcoming Webinars in the Series
- April 3 - Practical aspects in XRD/XRR analysis of materials
- April 6 - Introduction to Confocal Raman Microscopy
- April 8 - Rutherford Backscattering
- April 10 - Nanoindentation and Mechanical Properties with AFM