Lucille A. Giannuzzi Ph.D., FAVS, FMSA President EXpressLO LLC, "FIB and Materials: From Novelty to Necessity"

101 Thomas Building, March 30, 2017, 3:05 pm - 4:20 pm

Focused ion beam (FIB) microscopy, specimen preparation, and nanoprototyping has witnessed numerous advances over the past 20+ years.  First perceived as an expensive novelty, the FIB currently offers necessary and indispensable capabilities for any major research university, company, or national laboratory. FIB usage for site specific milling and deposition is now status quo. Standard specimen preparation protocol exists for high resolution transmission electron microscopy and other characterization analyses requiring minimal surface damage.  Over the years, these techniques improved with an understanding and application of the fundamentals of ion-solid interactions. Successive FIB slicing followed by imaging and associated analytical methods enable 3D tomographic materials characterization containing morphology, microstructure, chemistry, and crystallography.  The automation of these functions improves reliability, statistics, and throughput.  Despite its maturity, FIB instrumentation and applications continue to develop.  New sources emitting different ions species and beam currents allow materials characterization across the nano-, micro-, and macro- length scales. In this lecture, the evolution of FIB for materials characterization will be presented. Attention will be given to discoveries of structure/property relationships in materials possible only by FIB. In addition, the future of FIB will be discussed. Examples from metals, ceramics, polymers, composites, integrated circuits, minerals, biomaterials, and nuclear irradiated materials will be provided.