2017 McFarland Award: Lucille A. Giannuzzi

FIB and Materials: From Novelty to Necessity

Thursday, March 30, 2017
101 Thomas Building
Lucille A. Giannuzzi, Ph.D., FAVS, FMSA
L.A. Giannuzzi & Associates LLC, Fort Myers, FL. and EXpressLO LLC, Lehigh Acres, FL.


Focused ion beam (FIB) microscopy, specimen preparation, and nanoprototyping has witnessed numerous advances over the past 20+ years.  First perceived as an expensive novelty, the FIB currently offers necessary and indispensable capabilities for any major research university, company, or national laboratory. FIB usage for site specific milling and deposition is now status quo. Standard specimen preparation protocol exists for high resolution transmission electron microscopy and other characterization analyses requiring minimal surface damage.  Over the years, these techniques improved with an understanding and application of the fundamentals of ion-solid interactions. Successive FIB slicing followed by imaging and associated analytical methods enable 3D tomographic materials characterization containing morphology, microstructure, chemistry, and crystallography.  The automation of these functions improves reliability, statistics, and throughput.  Despite its maturity, FIB instrumentation and applications continue to develop.  New sources emitting different ions species and beam currents allow materials characterization across the nano-, micro-, and macro- length scales. In this lecture, the evolution of FIB for materials characterization will be presented. Attention will be given to discoveries of structure/property relationships in materials possible only by FIB. In addition, the future of FIB will be discussed. Examples from metals, ceramics, polymers, composites, integrated circuits, minerals, biomaterials, and nuclear irradiated materials will be provided.


Lucille A. Giannuzzi holds a B.E. in Engineering Science and M.S. in Materials Science and Engineering from Stony Brook University.  She received her Ph.D. from Penn State in Metals Science and Engineering and was a Post-Doc at the PSU Center for Advanced Materials. Prof. Giannuzzi was at the University of Central Florida for 10 years where she was a recipient of an NSF CAREER award. She joined FEI Company as a product marketing engineer for 7 years before founding her own consulting and product companies. Dr. Giannuzzi has applied focused ion beam and electron microscopy techniques to study the structure/property relationships in metals, alloys, ceramics, composites, polymers, minerals, bone/dental implants, irradiated, inorganic, and biological materials. She maintains professional affiliations in AVS, ACerS, ASM Intl., TMS, MRS, MSA, and MAS and is a Fellow of AVS and MSA. Dr. Giannuzzi has over 125 (co)authored publications; several FIB-related patents, contributed to several invited book chapters, and is co-editor of a book entitled “Introduction to Focused Ion Beams.”